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Towards the enhancement of medical imaging with non-destructive testing (NDT) CMOS sensors. Evaluation following IEC 62220-1-1:2015 international standard
Martini, N., Koukou, V., Fountos, G., Valais, I., Bakas, A., Ninos, K., Kandarakis, I., Panayiotakis, G., Michail, Ch.Volume:
10
Year:
2018
Language:
english
Journal:
Procedia Structural Integrity
DOI:
10.1016/j.prostr.2018.09.045
File:
PDF, 821 KB
english, 2018