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Determining the Compositional Profile of HgTe/CdxHg1 – xTe Quantum Wells by Single-Wavelength Ellipsometry
Shvets, V. A., Mikhailov, N. N., Ikusov, D. G., Uzhakov, I. N., Dvoretskii, S. A.Volume:
127
Language:
english
Journal:
Optics and Spectroscopy
DOI:
10.1134/S0030400X19080253
Date:
August, 2019
File:
PDF, 777 KB
english, 2019