![](/img/cover-not-exists.png)
[IEEE 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019 - Boston, MA, USA (2019.6.2-2019.6.7)] 2019 IEEE MTT-S International Microwave Symposium (IMS) - 207-257 GHz Integrated Sensing Readout System with Transducer in a 130-nm SiGe BiCMOS Technology
Wang, D., Yun, J., Eissa, M. H., Kucharski, M., Schmalz, K., Malignaggi, A., Wang, Y., Borngraber, J., Liang, Y., Ng, H. J., Le, Q. H., Huynh, D. K., Kampfe, T., Seidel, K., Kissinger, D.Year:
2019
Language:
english
DOI:
10.1109/MWSYM.2019.8700819
File:
PDF, 1.43 MB
english, 2019