Exploiting In-memory Data Patterns for Performance Improvement on Crossbar Resistive Memory
Wen, Wen, Zhao, Lei, Zhang, Youtao, Yang, JunYear:
2019
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2019.2940685
File:
PDF, 1.76 MB
english, 2019