![](/img/cover-not-exists.png)
Thickness Determination of Ultra-Thin Films on Si Substrates by EPMA
Christiani S. Campos, Marcos A. Z. Vasconcellos, Xavier Llovet, Francesc SalvatVolume:
145
Language:
english
Pages:
5
DOI:
10.1007/s00604-003-0120-3
Date:
April, 2004
File:
PDF, 146 KB
english, 2004