The Use of SIMS, SEM, EPMA, LRS and X-Ray Diffraction...

Microchimica Acta 2004 / 12 Vol. 148; Iss. 3-4

The Use of SIMS, SEM, EPMA, LRS and X-Ray Diffraction Measurements for the Examination of Corrosive Layers and Protective Coatings on Steels and Alloys in Advanced Power Stations

Hubertus Nickel, Leszek Niewolak, Joanna Zurek, Willem J. Quadakkers
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Volume:
148
Language:
english
Pages:
9
DOI:
10.1007/s00604-004-0267-6
Date:
December, 2004
File:
PDF, 558 KB
english, 2004
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