Atomic Level Characterization Based on Focus Modulation Electron Microscopy
Yoshizo Takai, Masaki Taya, Hidekazu Chikada, Yoshihide KimuraVolume:
155
Language:
english
Pages:
7
DOI:
10.1007/s00604-006-0501-5
Date:
September, 2006
File:
PDF, 228 KB
english, 2006