Absolute Determination of Characteristic X-Ray Yields with...

Absolute Determination of Characteristic X-Ray Yields with a Wavelength-Dispersive Spectrometer

Claude Merlet, Xavier Llovet
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Volume:
155
Language:
english
Pages:
6
DOI:
10.1007/s00604-006-0543-8
Date:
September, 2006
File:
PDF, 261 KB
english, 2006
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