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PERMITTIVITY MEASUREMENT OF THIN DIELECTRIC MATERIALS FROM REFLECTION-ONLY MEASUREMENTS USING ONE-PORT VECTOR NETWORK ANALYZERS
Hasar, Ugur CemVolume:
95
Year:
2009
Language:
english
Journal:
Progress In Electromagnetics Research
DOI:
10.2528/PIER09062501
File:
PDF, 2.34 MB
english, 2009