Investigation of Co/Cu/NiFe-Multilayers by X-Ray...

Microchimica Acta 2000 / 06 Vol. 133; Iss. 1-4

Investigation of Co/Cu/NiFe-Multilayers by X-Ray Reflectometry and Diffraction

Michael Hecker, Detlev Tietjen, Friedrich Prokert, Norbert Schell, Claus M. Schneider
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Volume:
133
Language:
english
Pages:
3
DOI:
10.1007/s006040070099
Date:
June, 2000
File:
PDF, 149 KB
english, 2000
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