XPS Depth Profile Analysis of a Thin Non-Conducting...

XPS Depth Profile Analysis of a Thin Non-Conducting Titanate Superlattice

Steffen Oswald, Wolfgang Häßler, Rainer Reiche, Johannes Lindner, François Weiss
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Volume:
133
Language:
english
Pages:
4
DOI:
10.1007/s006040070110
Date:
June, 2000
File:
PDF, 94 KB
english, 2000
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