Mapping Ferroelectricity in Hafnia Thin Films with STEM...

Microscopy and Microanalysis 2019 / 08 Vol. 25; Iss. S2

Mapping Ferroelectricity in Hafnia Thin Films with STEM EBIC

Chan, Ho Leung, Hubbard, William A., Lodico, Jared J., Regan, B. C.
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Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619009966
Date:
August, 2019
File:
PDF, 768 KB
english, 2019
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