Electrical and Structural Properties of In and In + C Doped...

Microscopy and Microanalysis 2016 / 07 Vol. 22; Iss. S3

Electrical and Structural Properties of In and In + C Doped Ge

Feng, R., Kremer, F., Sprouster, D. J., Mirzaei, S., Decoster, S., Glover, C. J., Medling, S. A., Pereira, L. M. C., Russo, S. P., Ridgway, M. C.
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Volume:
22
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927616008060
Date:
July, 2016
File:
PDF, 218 KB
2016
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