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[IEEE 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Auckland, New Zealand (2019.5.20-2019.5.23)] 2019 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Auto-focus pathology microscope using sub-array sampling

Wu, Po-Hsun, Weng, Chun-Jen, Cheng, Pi-Ying
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Year:
2019
DOI:
10.1109/I2MTC.2019.8826950
File:
PDF, 209 KB
2019
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