[IEEE 2019 Silicon Nanoelectronics Workshop (SNW) - Kyoto, Japan (2019.6.9-2019.6.10)] 2019 Silicon Nanoelectronics Workshop (SNW) - Error Crrection for Read-hot Data in 3D-TLC NAND Flash by Read-disturb Modeled Artificial Neural Network Coupled LDPC ECC
Kojima, Daiki, Nakamura, Toshiki, Takeuchi, KenYear:
2019
DOI:
10.23919/SNW.2019.8782950
File:
PDF, 138 KB
2019