![](/img/cover-not-exists.png)
Analytical validation of the Young-Dupre law for epitaxially-strained thin films
Davoli, Elisa, Piovano, PaoloJournal:
Mathematical Models and Methods in Applied Sciences
DOI:
10.1142/S0218202519500441
Date:
September, 2019
File:
PDF, 685 KB
2019