Analytical validation of the Young-Dupre law for...

Analytical validation of the Young-Dupre law for epitaxially-strained thin films

Davoli, Elisa, Piovano, Paolo
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Journal:
Mathematical Models and Methods in Applied Sciences
DOI:
10.1142/S0218202519500441
Date:
September, 2019
File:
PDF, 685 KB
2019
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