![](/img/cover-not-exists.png)
[IEEE 2019 42nd International Spring Seminar on Electronics Technology (ISSE) - Wroclaw, Poland (2019.5.15-2019.5.19)] 2019 42nd International Spring Seminar on Electronics Technology (ISSE) - Measurement of Thermal Properties and Interface Thermal Resistance of Thin Films by Thermoreflectance
Badine, Elie, Bardoux, Mathieu, Abboud, Nadine, Sahraoui, Abdelhak Hadj, Herro, ZiadYear:
2019
DOI:
10.1109/ISSE.2019.8810149
File:
PDF, 575 KB
2019