[IEEE 2019 China Semiconductor Technology International...

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[IEEE 2019 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2019.3.18-2019.3.19)] 2019 China Semiconductor Technology International Conference (CSTIC) - The Study of Metal Capacitor Transistor TDDB Failure Mechanism

Huang, Chong, Sun, Fangce, Zhang, Ming, Ji, Aiyan
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Year:
2019
DOI:
10.1109/cstic.2019.8755649
File:
PDF, 954 KB
2019
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