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A novel frequency-band-selecting pulsed eddy current testing method for the detection of a certain depth range of defects
Li, Peng, Xie, Shejuan, Wang, Kedian, Zhao, Ying, Zhang, Lei, Chen, Zhenmao, Uchimoto, Tetsuya, Takagi, ToshiyukiVolume:
107
Language:
english
Journal:
NDT & E International
DOI:
10.1016/j.ndteint.2019.102154
Date:
October, 2019
File:
PDF, 7.05 MB
english, 2019