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Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification
Jahan, Nusrat, Wang, Hanwei, Zhao, Shensheng, Dutta, Arkajit, Huang, Hsuan-Kai, Zhao, Yang, Chen, Yun-ShengVolume:
8
Language:
english
Journal:
Nanophotonics
DOI:
10.1515/nanoph-2019-0181
File:
PDF, 2.19 MB
english