S-band pulsed-RF operating life test on AlGaN/GaN HEMT...

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Microelectronics Reliability 2019 / 9

S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application

Moultif, N., Latry, O., Ndiaye, M., Neveu, T., Joubert, E., Moreau, C., Goupy, J-F.
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113434
Date:
September, 2019
File:
PDF, 3.74 MB
english, 2019
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