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A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm
Xiao, Jie, Shi, Zhan-Hui, Jiang, Jian-Hui, Yang, Xu-Hua, Huang, Yu-Jiao, Hu, Hai-GenVolume:
34
Language:
english
Journal:
Journal of Computer Science and Technology
DOI:
10.1007/s11390-019-1965-1
Date:
September, 2019
File:
PDF, 905 KB
english, 2019