![](/img/cover-not-exists.png)
SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark
Marroqui, D., Garrigos, A., Blanes, J.M., Gutierrez, R., Maset, E., Iannuzzo, F.Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113429
Date:
September, 2019
File:
PDF, 1.04 MB
english, 2019