Aluminum metallization and wire bonding aging in power MOSFET modules
Ruffilli, R., Berkani, M., Dupuy, P., Lefebvre, S., Weber, Y., Warot-Fonrose, B., Marcelot, C., Legros, M.Volume:
5
Year:
2018
Language:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2018.03.056
File:
PDF, 2.21 MB
english, 2018