Electron beam-induced current imaging with two-angstrom...

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Ultramicroscopy 2019 / 10

Electron beam-induced current imaging with two-angstrom resolution

Mecklenburg, Matthew, Hubbard, William A., Lodico, Jared J., Regan, B.C.
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Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.112852
Date:
October, 2019
File:
PDF, 4.25 MB
english, 2019
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