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IEEE Transactions on Industrial Informatics 2019

Deep Learning based Small Surface Defect Detection via Exaggerated Local Variation-based Generative Adversarial Network

Lian, Jian, Jia, Weikuan, Zareapoor, Masoumeh, Zheng, Yuanjie, Luo, Rong, Jain, Deepak Kumar, Kumar, Neeraj
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Industrial Informatics
DOI:
10.1109/TII.2019.2945403
File:
PDF, 5.38 MB
english, 2019
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