Understanding the metal-oxides induced reduction of the...

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Solid-State Electronics 2019 / 10

Understanding the metal-oxides induced reduction of the contact resistance in organic transistors

Donnhäuser, Shabnam, Minagawa, Masahiro, Blawid, Stefan, Claus, Martin
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Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2019.107676
Date:
October, 2019
File:
PDF, 780 KB
english, 2019
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