[ACM Press the 17th ACM-IEEE International Conference - La Jolla, California (2019.10.09-2019.10.11)] Proceedings of the 17th ACM-IEEE International Conference on Formal Methods and Models for System Design - MEMOCODE '19 - RTL bug localization through LTL specification mining (WIP)
Iyer, Vighnesh, Kim, Donggyu, Nikolic, Borivoje, Seshia, Sanjit A.Year:
2019
Language:
english
DOI:
10.1145/3359986.3361202
File:
PDF, 885 KB
english, 2019