Efficient extraction of consistent bit locations from...

Expert Systems with Applications 2020 / 02 Vol. 140

Efficient extraction of consistent bit locations from binarized iris features

Sadhya, Debanjan, De, Kanjar, Raman, Balasubramanian, Roy, Partha Pratim
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
140
Language:
english
Journal:
Expert Systems with Applications
DOI:
10.1016/j.eswa.2019.112884
Date:
February, 2020
File:
PDF, 2.88 MB
english, 2020
Conversion to is in progress
Conversion to is failed