Electron Ptychography Using Fast Binary 4D STEM Data

Microscopy and Microanalysis 2019 / 08 Vol. 25; Iss. S2

Electron Ptychography Using Fast Binary 4D STEM Data

O'Leary, Colum M., Liberti, Emanuela, Collins, Sean M., Johnstone, Duncan N., Rothmann, Mathias, Hou, Jingwei, Allen, Christopher S., Kim, Judy S., Bennett, Thomas D., Midgley, Paul A., Kirkland, Angu
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Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927619009048
Date:
August, 2019
File:
PDF, 215 KB
english, 2019
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