Subgrains, micro-twins and dislocations characterization in monolike Si using TEM and in-situ TEM
Lantreibecq, A., Monchoux, J.-Ph., Pihan, E., Marie, B., Legros, M.Volume:
5
Year:
2018
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2018.03.063
File:
PDF, 3.09 MB
2018