Exploiting In-memory Data Patterns for Performance...

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2019

Exploiting In-memory Data Patterns for Performance Improvement on Crossbar Resistive Memory

Wen, Wen, Zhao, Lei, Zhang, Youtao, Yang, Jun
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Year:
2019
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2019.2940685
File:
PDF, 1.76 MB
2019
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