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[ACM Press the Applied Networking Research Workshop - Prague, Czech Republic (2017.07.15-2017.07.15)] Proceedings of the Applied Networking Research Workshop on - ANRW '17 - Measurement Vantage Point Selection Using A Similarity Metric
Holterbach, Thomas, Aben, Emile, Pelsser, Cristel, Bush, Randy, Vanbever, LaurentYear:
2017
DOI:
10.1145/3106328.3106334
File:
PDF, 585 KB
2017