A damage-induced short-circuit diffusion model applied to...

A damage-induced short-circuit diffusion model applied to the oxidation calculation of ceramic matrix composites (CMCs)

Zhao, Yunong, Chen, Yanfei, He, Chunwang, Ai, Shigang, Fang, Daining
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Volume:
127
Journal:
Composites Part A: Applied Science and Manufacturing
DOI:
10.1016/j.compositesa.2019.105621
Date:
December, 2019
File:
PDF, 6.78 MB
2019
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