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[IEEE 2019 IEEE International Conference on Electro Information Technology (EIT) - Brookings, SD, USA (2019.5.20-2019.5.22)] 2019 IEEE International Conference on Electro Information Technology (EIT) - Performance Comparison of Machine Learning Algorithms in Detecting Jamming Attacks on ADS-B0 Devices
Manesh, Mohsen Riahi, Velashani, Mahdi Saeedi, Ghribi, Elias, Kaabouch, NaimaYear:
2019
Language:
english
DOI:
10.1109/EIT.2019.8833789
File:
PDF, 217 KB
english, 2019