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A Continuum Multi-Disconnection-Mode model for grain boundary migration
Wei, Chaozhen, Thomas, Spencer L., Han, Jian, Srolovitz, David J., Xiang, YangVolume:
133
Journal:
Journal of the Mechanics and Physics of Solids
DOI:
10.1016/j.jmps.2019.103731
Date:
December, 2019
File:
PDF, 1.45 MB
2019