![](/img/cover-not-exists.png)
[IEEE 2019 1st International Conference on Industrial Artificial Intelligence (IAI) - Shenyang, China (2019.7.23-2019.7.27)] 2019 1st International Conference on Industrial Artificial Intelligence (IAI) - Two-Step Dynamic Slow Feature Analysis for Dynamic Process Monitoring
Si, Yabin, Wang, YouqingYear:
2019
Language:
english
DOI:
10.1109/ICIAI.2019.8850780
File:
PDF, 1.30 MB
english, 2019