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The role of interface traps, series resistance and (Ni-doped PVA) interlayer effects on electrical characteristics in Al/p-Si (MS) structures
Demirezen, SelçukLanguage:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-019-02352-3
Date:
October, 2019
File:
PDF, 1.57 MB
english, 2019