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Observation of Damage During Dynamic Compression of Production and Low-Defect HMX Crystals in Sylgard® Binder Using X-Ray Phase Contrast Imaging
Paulson, Shane C., Roberts, Zane A., Sorensen, Christian J., Kerschen, Nicholas E., Harr, Michael H., Parab, Niranjan D., Sun, Tao, Fezzaa, Kamel, Son, Steven F., Chen, Wayne W.Language:
english
Journal:
Journal of Dynamic Behavior of Materials
DOI:
10.1007/s40870-019-00225-8
Date:
October, 2019
File:
PDF, 3.05 MB
english, 2019