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[AIP Beam instrumentation - Argonne, Illinois (USA) (May 1996)] AIP Conference Proceedings - Beam monitors based on residual gas ionization
Vignet, Jean-Luc P., Anne, Rémy M., Georget, Yvon R., Hue, Robert E., Tribouillard, Christian H.Volume:
390
Year:
1997
Language:
english
DOI:
10.1063/1.52280
File:
PDF, 737 KB
english, 1997