Determination of Defect Densities in Thin (i) a‐Si:H Used...

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physica status solidi (RRL) - Rapid Research Letters 2019 / 09

Determination of Defect Densities in Thin (i) a‐Si:H Used as the Passivation Layer in a‐Si:H/c‐Si Heterojunction Solar Cells from Static Planar Conductance Measurements

Levtchenko, Alexandra, Le Gall, Sylvain, Brüggemann, Rudolf, Kleider, Jean-Paul
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Language:
english
Journal:
physica status solidi (RRL) – Rapid Research Letters
DOI:
10.1002/pssr.201900411
Date:
September, 2019
File:
PDF, 966 KB
english, 2019
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