Phonon Scattering in Quantitative High-Resolution Electron...

Microscopy and Microanalysis 2002 / 08 Vol. 8; Iss. S02

Phonon Scattering in Quantitative High-Resolution Electron Microscopy – effects, problems and approaches

Wang, Zhong Lin (ZL)
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Volume:
8
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927602104594
Date:
August, 2002
File:
PDF, 483 KB
english, 2002
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