Transition Edge Sensor Fabrication
Nelms, K. L., Liu, D., McCammon, D., Rocks, L., Sanders, W. T., Tan, P., Vaillancourt, J.Volume:
8
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927602105757
Date:
August, 2002
File:
PDF, 284 KB
english, 2002