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Automated Crystallography and Grain Mapping in the TEM
Clayton, F. Bo, Kempshall, Brian W., Schwarz, Stephen M., Giannuzzi, Lucille A.Volume:
8
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927602106283
Date:
August, 2002
File:
PDF, 1.70 MB
english, 2002