Nanometric-scale Characterization of Mechanical Properties...

Microscopy and Microanalysis 2003 / 08 Vol. 9; Iss. S02

Nanometric-scale Characterization of Mechanical Properties of Materials by Atomic Force Microscopy

Soifer, Ya. M., Verdyan, A., Lapsker, I., Azoulay, J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
9
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927603440336
Date:
August, 2003
File:
PDF, 402 KB
english, 2003
Conversion to is in progress
Conversion to is failed