Integrated SIMS-AFM Instrument for Accurate...

Microscopy and Microanalysis 2015 / 08 Vol. 21; Iss. S3

Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis

Fleming, Y., Wirtz, T., Eswara Moorthy, S.
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615007965
Date:
August, 2015
File:
PDF, 335 KB
english, 2015
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