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Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques
Oleshko, V.P., Twedt, K.A., Soles, C.L., McClelland, J.J.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761600862x
Date:
July, 2016
File:
PDF, 759 KB
english, 2016