Improved 4D-STEM Strain Mapping Precision Using Patterned...

Microscopy and Microanalysis 2019 / 08 Vol. 25; Iss. S2

Improved 4D-STEM Strain Mapping Precision Using Patterned Probes

Zeltmann, Steven E., Müller, Alexander, Bustillo, Karen C., Savitzky, Benjamin H., Minor, Andrew M, Ophus, Colin
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Volume:
25
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927619010523
Date:
August, 2019
File:
PDF, 813 KB
english, 2019
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