Variability-aware cryogenic models of mosfets: validation...

Semiconductor Science and Technology 2019 / 11 Vol. 34; Iss. 11

Variability-aware cryogenic models of mosfets: validation and circuit design

Kabaoğlu, Aykut, Şahin-Solmaz, Nergiz, İlik, Sadık, Uzun, Yasemin, Yelten, Mustafa Berke
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Volume:
34
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab3ff9
Date:
November, 2019
File:
PDF, 1.50 MB
english, 2019
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