Simulation study of a novel thin layer SOI carrier-stored...

Semiconductor Science and Technology 2019 / 11 Vol. 34; Iss. 11

Simulation study of a novel thin layer SOI carrier-stored TLIGBT with self-biased pMOS

Yi, Bo, Lin, Jia, Hu, Huan, Wu, Jiayu, Yang, RuiFeng, Kong, MouFu, Li, Ping, Chen, XingBi
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Volume:
34
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/ab400f
Date:
November, 2019
File:
PDF, 1.66 MB
english, 2019
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